Disable tests for frequecy measurements.
- fix a null reference exception
- remove a duplicate test in SensorTest.java

Change-Id: I455749972bc92d71a4686cbb7870ee808e3b3e40
diff --git a/tests/tests/hardware/src/android/hardware/cts/SensorCommonTests.java b/tests/tests/hardware/src/android/hardware/cts/SensorCommonTests.java
index 326963c..b535c71 100644
--- a/tests/tests/hardware/src/android/hardware/cts/SensorCommonTests.java
+++ b/tests/tests/hardware/src/android/hardware/cts/SensorCommonTests.java
@@ -438,7 +438,7 @@
     /**
      * Tests for sensor characteristics.
      */
-    public void testEventJittering() {
+    public void ignore_testEventJittering() {
         final long EXPECTED_TIMESTAMP_NS = this.getMaxFrequencySupportedInuS() * 1000;
         final long THRESHOLD_IN_NS = EXPECTED_TIMESTAMP_NS / 10; // 10%
 
@@ -463,7 +463,7 @@
         }
     }
 
-    public void testFrequencyAccuracy() {
+    public void ignore_testFrequencyAccuracy() {
         final long EXPECTED_TIMESTAMP_NS = this.getMaxFrequencySupportedInuS() * 1000;
         final long THRESHOLD_IN_NS = EXPECTED_TIMESTAMP_NS / 10; // 10%
 
diff --git a/tests/tests/hardware/src/android/hardware/cts/SensorIntegrationTests.java b/tests/tests/hardware/src/android/hardware/cts/SensorIntegrationTests.java
index f764c6c..7272d72 100644
--- a/tests/tests/hardware/src/android/hardware/cts/SensorIntegrationTests.java
+++ b/tests/tests/hardware/src/android/hardware/cts/SensorIntegrationTests.java
@@ -60,30 +60,6 @@
     /**
      * Test cases.
      */
-    public void testBatchAndFlush() throws InterruptedException {
-        List<Sensor> sensorList = mSensorManager.getSensorList(Sensor.TYPE_ALL);
-        for(Sensor sensor : sensorList) {
-            // skip all non-continuous mode sensors.
-            switch(sensor.getType()) {
-                case Sensor.TYPE_SIGNIFICANT_MOTION:
-                case Sensor.TYPE_STEP_COUNTER:
-                case Sensor.TYPE_STEP_DETECTOR:
-                case Sensor.TYPE_LIGHT:
-                case Sensor.TYPE_PROXIMITY:
-                case Sensor.TYPE_AMBIENT_TEMPERATURE:
-                    continue;
-            }
-
-            TestSensorManager sensorManager = new TestSensorManager(this, mSensorManager, sensor);
-            sensorManager.registerBatchListener(SensorManager.SENSOR_DELAY_NORMAL, 0);
-
-            // wait for 25 events and call flush
-            sensorManager.getEvents(25);
-            sensorManager.waitForFlush();
-
-            sensorManager.unregisterListener();
-        }
-    }
 
     /**
      * Regress:
diff --git a/tests/tests/hardware/src/android/hardware/cts/helpers/TestSensorManager.java b/tests/tests/hardware/src/android/hardware/cts/helpers/TestSensorManager.java
index 9a95e9b..98a0af0 100644
--- a/tests/tests/hardware/src/android/hardware/cts/helpers/TestSensorManager.java
+++ b/tests/tests/hardware/src/android/hardware/cts/helpers/TestSensorManager.java
@@ -171,7 +171,7 @@
         private final ConcurrentLinkedDeque<SensorEventForTest> mSensorEventsList =
                 new ConcurrentLinkedDeque<SensorEventForTest>();
         private volatile CountDownLatch mEventLatch;
-        private volatile CountDownLatch mFlushLatch;
+        private volatile CountDownLatch mFlushLatch = new CountDownLatch(1);
 
         @Override
         public void onSensorChanged(SensorEvent event) {
@@ -199,9 +199,11 @@
 
         public void waitForFlushComplete() throws InterruptedException {
             CountDownLatch latch = mFlushLatch;
-            mAssert.assertTrue(
-                    "WaitForFlush",
-                    latch.await(WAIT_TIMEOUT_IN_SECONDS, TimeUnit.SECONDS));
+            if(latch != null) {
+                mAssert.assertTrue(
+                        "WaitForFlush",
+                        latch.await(WAIT_TIMEOUT_IN_SECONDS, TimeUnit.SECONDS));
+            }
         }
 
         public void waitForEvents(int eventCount) {