commit 9c747f6dac07d7b55a484c58883ca86a730dc799
author Hridya Valsaraju <hridya@google.com> Mon Apr 03 08:52:07 2017 -0700
committer Zhuoyao Zhang <zhuoyao@google.com> Wed May 10 13:18:32 2017 -0700
tree 42beec6c0514d72c95205e386f976af0683897d0
parent b602cf1514fff1fc06de63600c9803abc5298124

Stop packaging test HALs in debug/eng builds for VTS

These will now be pushed via AndroidTest.xml

Test: Run VTS test
Bug: 36818001
Change-Id: I2a76e060c404174fd6a55554874263be45b73325

device-common.mk

diff --git a/device-common.mk b/device-common.mk
index c909753..8b93e92 100644
--- a/device-common.mk
+++ b/device-common.mk
@@ -387,14 +387,6 @@
 
 # Library used for VTS tests  (only for userdebug and eng builds)
 ifneq (,$(filter userdebug eng, $(TARGET_BUILD_VARIANT)))
-# Test HAL for hwbinder performance benchmark.
-PRODUCT_PACKAGES += \
-     android.hardware.tests.libhwbinder@1.0-impl
-
-# Test HAL for FMQ performance benchmark.
-PRODUCT_PACKAGES += \
-     android.hardware.tests.msgq@1.0-impl
-
 # For VTS profiling.
 PRODUCT_PACKAGES += \
      libvts_profiling \