Adapt disassembler tests for updated PASS/DROP output

Adjusted disassembler tests to align with changes made to PASS and DROP
opcode output formatting.

Test: TH
Change-Id: I142c2732854a3fa32e2e948891226fd373befb3b
diff --git a/tests/unit/src/android/net/apf/ApfV5Test.kt b/tests/unit/src/android/net/apf/ApfV5Test.kt
index 8449c22..11ab58d 100644
--- a/tests/unit/src/android/net/apf/ApfV5Test.kt
+++ b/tests/unit/src/android/net/apf/ApfV5Test.kt
@@ -328,7 +328,7 @@
                 program
         )
         assertContentEquals(
-                listOf("0: pass         129"),
+                listOf("0: pass        counter=129"),
                 ApfJniUtils.disassembleApf(program).map { it.trim() }
         )
 
@@ -345,7 +345,7 @@
                 program
         )
         assertContentEquals(
-                listOf("0: drop         1000"),
+                listOf("0: drop        counter=1000"),
                 ApfJniUtils.disassembleApf(program).map { it.trim() }
         )
 
@@ -361,7 +361,7 @@
                 program
         )
         assertContentEquals(
-                listOf("0: pass         10"),
+                listOf("0: pass        counter=10"),
                 ApfJniUtils.disassembleApf(program).map { it.trim() }
         )
 
@@ -377,7 +377,7 @@
                 program
         )
         assertContentEquals(
-                listOf("0: drop         37"),
+                listOf("0: drop        counter=37"),
                 ApfJniUtils.disassembleApf(program).map { it.trim() }
         )