Adapt disassembler tests for updated PASS/DROP output
Adjusted disassembler tests to align with changes made to PASS and DROP
opcode output formatting.
Test: TH
Change-Id: I142c2732854a3fa32e2e948891226fd373befb3b
diff --git a/tests/unit/src/android/net/apf/ApfV5Test.kt b/tests/unit/src/android/net/apf/ApfV5Test.kt
index 8449c22..11ab58d 100644
--- a/tests/unit/src/android/net/apf/ApfV5Test.kt
+++ b/tests/unit/src/android/net/apf/ApfV5Test.kt
@@ -328,7 +328,7 @@
program
)
assertContentEquals(
- listOf("0: pass 129"),
+ listOf("0: pass counter=129"),
ApfJniUtils.disassembleApf(program).map { it.trim() }
)
@@ -345,7 +345,7 @@
program
)
assertContentEquals(
- listOf("0: drop 1000"),
+ listOf("0: drop counter=1000"),
ApfJniUtils.disassembleApf(program).map { it.trim() }
)
@@ -361,7 +361,7 @@
program
)
assertContentEquals(
- listOf("0: pass 10"),
+ listOf("0: pass counter=10"),
ApfJniUtils.disassembleApf(program).map { it.trim() }
)
@@ -377,7 +377,7 @@
program
)
assertContentEquals(
- listOf("0: drop 37"),
+ listOf("0: drop counter=37"),
ApfJniUtils.disassembleApf(program).map { it.trim() }
)