| commit | 3e19d11d5ba6b48a370d4471049dae708750dee7 | [log] [tgz] |
|---|---|---|
| author | Simran Basi <sbasi@google.com> | Wed Mar 15 14:58:00 2017 -0700 |
| committer | Simran Basi <sbasi@google.com> | Wed Mar 15 14:58:00 2017 -0700 |
| tree | 829e88892beaeafd01dac6c8ab8f48a2c685ca75 | |
| parent | 26595cec6f2fb8468b175678f47da27674d959dd [diff] |
frameworks/opt/vcard: Add APCT tests to the device-tests suite.
This CL adds the APCT tests within this project to
a similar suite as CTS known as device-tests.
The current method of running APCT tests in the infrastructure
is unaffected.
Bug: 35882476
Test: `make dist device-tests -j` and local builds of
continuous_instrumentation_tests & continuous_native_tests
Change-Id: I170f60db4f0c956d631c4120a3f6c02ba8ce871e