)]}'
{
  "commit": "3a90060f21ce8a31b30c28de9f25d98f92b1d0ee",
  "tree": "513d77268d2189d9a37a4dc7617446e8940683f0",
  "parents": [
    "c070509a4a48d64c12d18400da8675538f4a666a"
  ],
  "author": {
    "name": "Alex Ray",
    "email": "aray@google.com",
    "time": "Tue Apr 15 12:53:13 2014 -0700"
  },
  "committer": {
    "name": "Bill Yi",
    "email": "byi@google.com",
    "time": "Tue Jun 17 14:19:45 2014 -0700"
  },
  "message": "hardware: consumerir: Increase test pattern length\n\nIncrease test pattern length by roughly 10x from ~50 milliseconds to ~500.\nIncrease test error margin from 10% to 50%.\n\nDevices must be within 50% of the pattern length for transmit, including some\nfixed communication latency between the app and hardware.  The point of this\ntest is to detect devices that are using an incorrect counting scheme (e.g.\nperiods instead of microseconds) or devices that are wildly off in transmitting\npatterns.\n\nThis will still reject the cases we want to fail, while allowing for a little\nmore of a fixed communication latency, for the cost of a slightly longer runtime\nfor the test.\n\nBug: 14057146\nChange-Id: I4348c1ebb4eeaa5b9ca20f678c0074736b272f63\nSigned-off-by: Alex Ray \u003caray@google.com\u003e\n",
  "tree_diff": [
    {
      "type": "modify",
      "old_id": "d88521ed222339053db61bcf7fdf685a9b87cfc5",
      "old_mode": 33188,
      "old_path": "tests/tests/hardware/src/android/hardware/consumerir/cts/ConsumerIrTest.java",
      "new_id": "e06adacbf0e3ff51badfc1c6553817d7c6964dff",
      "new_mode": 33188,
      "new_path": "tests/tests/hardware/src/android/hardware/consumerir/cts/ConsumerIrTest.java"
    }
  ]
}